粉體行業(yè)在線展覽
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647
DBT1000 | DBT-1200 | ||||
Speci? cations: Die size: from 300x300μm Thickness: from 3 mil and up 2 basic con? gurations: ? Modul I : XYZ and Theta for Chip handling ? Modul II : XYZ, hi resolution, for multi chuck Shuttle and pin Test centering Z motion with adjustable angle Pickup Tool offset to Crosshair: programmable Test Pin to crosshair: programmable Joystick: proportionnal speed Chip hold on chuck by vacuum Two LCD display, used for wafer handling and for Test Monitoring. Video Target generator for alignment. Lights: Direct and pen LED lights. | Speci?cations: Die size: from 250x250μm (10mil) Thickness: from 75μm, (3 mil) and up 2 basic con? gurations: ? Modul I : XYZ and Theta for Chip handling, ? Modul II : XYZ, hi resolution, for multi chuck Shuttle and pin Test centering Z motion with adjustable angle Pickup Tool offset to Crosshair: programmable Test Pin to crosshair: programmable Joystick: proportionnal speed Chip hold on chuck by vacuum Two LCD display, used for wafer handling and for Test Monitoring. Video Target generator for alignment. Lights: Direct and pen LED lights. Facilities: Power: 100-240vac |